Tracker ground support equipment
Silicon detector structure (PA fig. 3.13-3.16)
n/p-doped Si (PA fig. 3.2-3.5)
p-n junction (PA fig. 3.7-3.10)
Field and depletion width at p+nn+ junction (PA fig. 3.11, 3.12)
Punch through method (PA fig. 3.17-3.20)
MOSFET and FOXFET (PA fig. 3.12-3.24
AMS daisy chaining (PA fig. 3.25, 4.9)
Noise contributions (PA fig. 3.31-3.33)
AMS-01 and AMS-02 sensors (PA fig. 4.3)
Sensor metalization and structure (NIM fig. 2.58, PA fig. 5.1)
Gate and p-stop (PA fig. 4.4-4.6)
Antireflective sensors (PA fig. 4.7, 4.8)
Front end hybrids (PA fig. 4.13, 4.14)
K5, K7 Upilex (PA fig. 4.11,4.12)
VA64hdr_9 (PA fig. 4.16, 4.17)
VA reset, readout and test sequence (PA tab. 4.5)
HCC control sequence (PA fig.4.18)
AMS-01 and AMS-02 biasing method (PA fig. 4.20)
Probe station (PA fig. 6.1-6.3)
Sensor alignment precision (NIM fig. 2.60)
Upilex gluing tools (PA fig. 5.4)
Upilex gluing steps (PA fig. 5.5-5.7)
Reinforcement gluing steps (PA fig. 5.8-5.13)
K-hybrid gluing steps (PA fig. 5.14-5.16)
S-hybrid gluing steps (PA fig. 5.17-5.20)
Hybrid spacer and thermal grease (PA fig. 5.21-5.23)
Feet gluing steps (PA fig. 5.21-5.23)
Spacer gluing and shield wrapping
Ladders ready for mount (NIM fig. 2.61)
AMS-01 plane with AMS-02 ladder
Odd layers longitudinal tolerance