WaferTestPanel true 0 0 531 284 0 0 400 0 Qt::WheelFocus Wafer Test Panel 75 true Wafer Test Panel Qt::AlignCenter Prober types: Qt::Horizontal QSizePolicy::Fixed 28 20 New Prober Qt::Horizontal 40 20 true Load Prober Qt::Horizontal QSizePolicy::Expanding 28 31 true Save Prober Output Folder false true Browse Wafer label AB12CD34 Wafer SN 0 Qt::Horizontal QSizePolicy::Fixed 40 20 140 0 label by chip index label by row,col label by row, col and sub-die Chip: index 1 col false 0 row false 0 Qt::Horizontal QSizePolicy::Fixed 40 20 false A B Qt::Horizontal 40 20 start at first chip true Qt::Horizontal QSizePolicy::Fixed 40 20 No. of chips to probe (0: probe all) 999999 Qt::Horizontal 40 20 No. of chips probed 0 0 0 0 0 255 127 127 255 63 63 255 0 0 127 0 0 170 0 0 0 255 255 255 0 0 0 255 255 255 0 0 255 0 0 0 127 127 255 255 255 220 0 0 0 0 0 0 0 0 255 127 127 255 63 63 255 0 0 127 0 0 170 0 0 0 255 255 255 0 0 0 255 255 255 0 0 255 0 0 0 127 127 255 255 255 220 0 0 0 0 0 127 0 0 255 127 127 255 63 63 255 0 0 127 0 0 170 0 0 127 255 255 255 0 0 127 0 0 255 0 0 255 0 0 0 0 0 255 255 255 220 0 0 0 50 false QFrame::Box 1 false QLCDNumber::Filled Qt::Horizontal QSizePolicy::Fixed 20 15 ---- Qt::Horizontal 40 20 Qt::Horizontal